Data retention characterization of gate-injected gold-nanoparticle non-volatile memory with low-damage CF <inf>4</inf> -plasma-treated blocking oxide layer

Liu, Y.-H.Y.-H.LiuKao, C.-H.C.-H.KaoCheng, T.-C.T.-C.ChengWu, C.-I.C.-I.WuWang, J.-C.J.-C.WangCHIH-I WU2020-06-112020-06-112017https://scholars.lib.ntu.edu.tw/handle/123456789/498012Data retention characterization of gate-injected gold-nanoparticle non-volatile memory with low-damage CF <inf>4</inf> -plasma-treated blocking oxide layerjournal article10.3390/nano71103852-s2.0-85034430228https://www.scopus.com/inward/record.uri?eid=2-s2.0-85034430228&doi=10.3390%2fnano7110385&partnerID=40&md5=618c2f592c82b79877fb8682c8821fd8