Improvement of Hot-Electron-Induced Degradation in MOS Capacitors by Repeated Irradiation-Then-Anneal Treatments

JENN-GWO HWU2018-09-102018-09-101990http://www.scopus.com/inward/record.url?eid=2-s2.0-0025386444&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/288951Improvement of Hot-Electron-Induced Degradation in MOS Capacitors by Repeated Irradiation-Then-Anneal Treatmentsjournal article10.1109/55.46935