Determine the Minority Carrier Lifetime in P/N Junction Diode Using the Lag Effect of a CID Emulator

Tseng, Y. H.Y. H.Tseng林浩雄Lin, Hao-HsiungHao-HsiungLin2009-02-042018-07-062009-02-042018-07-061987http://ntur.lib.ntu.edu.tw//handle/246246/121318en-USDetermine the Minority Carrier Lifetime in P/N Junction Diode Using the Lag Effect of a CID Emulatorconference paper