Hsing-Hung HsiehToshio KamiyaKenji NomuraHideo HosonoCHUNG-CHIH WU2018-09-102018-09-102008-01http://scholars.lib.ntu.edu.tw/handle/123456789/342710Modeling of Amorphous InGaZnO4 Thin Film Transistors and Their Subgap Density of Statesjournal article10.1063/1.28574632-s2.0-41649120938WOS:000254669900100