X-ray absorption fine structure of ZnO thin film on Si and sapphire grown by MOCVD

Xin, J.J.XinChang, C.M.C.M.ChangHsueh, C.-H.C.-H.HsuehLee, J.-F.J.-F.LeeChen, J.-M.J.-M.ChenLin, H.-H.H.-H.LinLu, N.N.LuFerguson, I.T.I.T.FergusonGuan, Y.Y.GuanWan, L.L.WanYang, Q.Q.YangFeng, Z.C.Z.C.FengHAO-HSIUNG LIN2020-06-112020-06-112016https://scholars.lib.ntu.edu.tw/handle/123456789/500452X-ray absorption fine structure of ZnO thin film on Si and sapphire grown by MOCVDconference paper10.1109/ISNE.2016.75433132-s2.0-84985940849https://www.scopus.com/inward/record.uri?eid=2-s2.0-84985940849&doi=10.1109%2fISNE.2016.7543313&partnerID=40&md5=6aa6522149b21af9a67e59af9e8ee817