Kim, J.J.KimEllis, D. S.D. S.EllisZhang, H.H.ZhangKim, Y. J.Y. J.KimHill, J. P.J. P.HillChou, F. C.F. C.ChouGog, T.T.GogCasa, D.D.Casa2020-04-212020-04-21200910980121https://scholars.lib.ntu.edu.tw/handle/123456789/484856Comparison of resonant inelastic x-ray scattering spectra and dielectric loss functions in copper oxidesjournal article10.1103/PhysRevB.79.094525