Investigation of frequency/thickness dependent configurable dielectric properties on P(VDF-TrFE-CTFE)-MIS structures

Chen, P.-H.P.-H.ChenWang, I.-S.I.-S.WangHsueh, H.-T.H.-T.HsuehCHIH-TING LIN2020-06-112020-06-112016https://scholars.lib.ntu.edu.tw/handle/123456789/499152Investigation of frequency/thickness dependent configurable dielectric properties on P(VDF-TrFE-CTFE)-MIS structuresconference paper10.1109/INEC.2016.75892732-s2.0-84992756805https://www.scopus.com/inward/record.uri?eid=2-s2.0-84992756805&doi=10.1109%2fINEC.2016.7589273&partnerID=40&md5=5dd9992dbfea4885603b107d81df3ec7