Kao, HHKaoChin, AlbertAlbertChinLiao, CCLiaoMcalister, SeanSeanMcalisterKwo, JJKwoMINGHWEI HONG2018-09-102018-09-102006http://scholars.lib.ntu.edu.tw/handle/123456789/323246Measuring and modeling the scaling trend of the RF noise in MOSFETsbook part