Ge outdiffusion effect on flicker noise in strained-Si nMOSFETs

CHEE-WEE LIUHua, W.-C.W.-C.HuaLee, M.H.M.H.LeeChen, P.S.P.S.ChenMaikap, S.S.MaikapLiu, C.W.C.W.LiuChen, K.M.K.M.ChenCHEE-WEE LIU2018-09-102018-09-102004http://www.scopus.com/inward/record.url?eid=2-s2.0-5044252616&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/309373Ge outdiffusion effect on flicker noise in strained-Si nMOSFETsjournal article10.1109/LED.2004.834884