Effect of palladium content on microstructures, electrical and optical properties of NiO films by rf sputtering

Chen S.C.Kuo T.Y.Lin Y.C.Hsu S.W.HSIN-CHIH LIN2019-11-272019-11-27201300406090https://www.scopus.com/inward/record.uri?eid=2-s2.0-84888643390&doi=10.1016%2fj.tsf.2013.07.017&partnerID=40&md5=41fd48c20de57423ce1afa77040daba7https://scholars.lib.ntu.edu.tw/handle/123456789/432434Effect of palladium content on microstructures, electrical and optical properties of NiO films by rf sputteringconference paper10.1016/j.tsf.2013.07.0172-s2.0-84888643390