Evaluating Single Event Effects in Radiation-Tolerant Chips Using Short-Pulse Laser

Hung C.P.Yu, Shih-BoShih-BoYuJIA-HAN LI2025-05-172025-05-172024-09-16https://www.scopus.com/record/display.uri?eid=2-s2.0-85217682745&origin=recordpagehttps://scholars.lib.ntu.edu.tw/handle/123456789/729388falseEvaluating Single Event Effects in Radiation-Tolerant Chips Using Short-Pulse Laserconference paper2-s2.0-85217682745