Temperature and active layer thickness dependent stability of on-plastic a-Si:H thin film transistors fabricated at 150°C

Chen, J.-Z.J.-Z.ChenCheng, I.-C.I.-C.ChengI-CHUN CHENG2018-09-102018-09-102008http://www.scopus.com/inward/record.url?eid=2-s2.0-69949153093&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/340864Temperature and active layer thickness dependent stability of on-plastic a-Si:H thin film transistors fabricated at 150°Cconference paper