Investigation of GaN Fin-HEMTs with micron-scale fin width

Chang, L.-C.L.-C.ChangYang, M.M.YangJiang, Y.-H.Y.-H.JiangCHAO-HSIN WU2020-06-292020-06-292017https://scholars.lib.ntu.edu.tw/handle/123456789/505948Investigation of GaN Fin-HEMTs with micron-scale fin widthconference paper10.1117/12.22572112-s2.0-85017031041https://www.scopus.com/inward/record.uri?eid=2-s2.0-85017031041&doi=10.1117%2f12.2257211&partnerID=40&md5=aa12ff4b0969ef77fb4a7e4d76042a9c