Dept. of Electr. Eng., National Taiwan Univ.Kung, Chen-PinChen-PinKungHuang, Chun-JiehChun-JiehHuangLin, Chen-ShangChen-ShangLin2007-04-192018-07-062007-04-192018-07-061995-11http://ntur.lib.ntu.edu.tw//handle/246246/2007041910032100application/pdf1021258 bytesapplication/pdfen-USFast fault simulation for BIST applicationsjournal article10.1109/ATS.1995.485322http://ntur.lib.ntu.edu.tw/bitstream/246246/2007041910032100/1/00485322.pdf