Stability of amorphous silicon thin film transistors under prolonged high compressive strain

Chen, J.-Z.J.-Z.ChenCheng, I.-C.I.-C.ChengWagner, S.S.WagnerJackson, W.W.JacksonPerlov, C.C.PerlovTaussig, C.C.TaussigI-CHUN CHENG2018-09-102018-09-102007http://www.scopus.com/inward/record.url?eid=2-s2.0-41549123311&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/332092Stability of amorphous silicon thin film transistors under prolonged high compressive strainconference paper