Li, Jin-FuJin-FuLiJIUN-LANG HUANG2020-06-112020-06-1120182168-2356https://scholars.lib.ntu.edu.tw/handle/123456789/501358https://www.scopus.com/inward/record.uri?eid=2-s2.0-85041376230&doi=10.1109%2fMDAT.2018.2800286&partnerID=40&md5=fcabb80a3b5466ba1c2e43d3d1720c3eThe Asian Test Symposium 2017 (ATS'17) was held during 27-30 November 2017 at Palais de Chine Hotel, Taipei, Taiwan. The ATS has been the largest event in Asia that focuses on the testing of integrated circuits and systems, and it has attracted researchers and engineers from all over the world to share their experiences and knowledge. ATS'17 was organized by the National Central University, which cosponsored the event jointly with IEEE Test Technology Technical Council. ATS'17 was also supported by the following corporate sponsors: Ministry of Science Technology, Bureau of Foreign Trade, Ministry of Education, Taipei Department of Information and Tourism, Synopsys, Mentor Graphics, Cadence, Industrial Technology Research Institute (ITRI), and Realtek. © 2013 IEEE.Industrial research; International trade; Circuits and systems; Conference report; Corporate sponsors; Industrial Technology Research Institute; Mentor Graphics; Ministry of Education; Science technologies; Test technology; Engineering educationconference paper10.1109/MDAT.2018.28002862-s2.0-85041376230WOS:000428865000013