Low-temperature grown single-crystal Si on epi Ge(001)-2 × 1 and its oxidation: Electronic structure study via synchrotron radiation photoemission

Cheng, Y.-T.Y.-T.ChengWan, H.-W.H.-W.WanCheng, C.-K.C.-K.ChengCheng, C.-P.C.-P.ChengKwo, J.R.J.R.KwoHong, M.M.HongMINGHWEI HONGCHIA-KUEN CHENG2021-07-282021-07-282020https://www.scopus.com/inward/record.url?eid=2-s2.0-85088010372&partnerID=40&md5=1e61a1d3a7414a33d4784886cdd3b366https://scholars.lib.ntu.edu.tw/handle/123456789/573744[SDGs]SDG6Low-temperature grown single-crystal Si on epi Ge(001)-2 × 1 and its oxidation: Electronic structure study via synchrotron radiation photoemissionjournal article10.35848/1882-0786/ab9f622-s2.0-85088010372WOS:000551668100001