朱仁佑汪天仁張祐嘉葉吉田王俊凱2020-06-032020-06-032008https://scholars.lib.ntu.edu.tw/handle/123456789/496556zh散射式掃描近場光學顯微鏡一次十奈米級光學檢測Scattering-Type Scanning Near-Field Optical Microscopy-Optical Characterization in sub-10 nm Scalejournal article10.29662/IT.200804.0005