Dielectric constant measurement using metallized slot substrate integrated waveguide at PCB process

Pei-Tzu ChenYu-Heng CaiJoseph ChengJason LeeChung-Hsing LiaoHsin-Chia LuHSIN-CHIA LU2019-10-312019-10-312018https://scholars.lib.ntu.edu.tw/handle/123456789/429922Dielectric constant measurement using metallized slot substrate integrated waveguide at PCB processconference paper10.23919/apmc.2018.86174902-s2.0-85061842487