Extension of the Rosencwaig-Gersho-Fernelius photothermal deflection spectroscopy model to account for multiple reflections in epitaxial samples

Chan, I. C. W.I. C. W.ChanBeaudoin, M.M.BeaudoinI-CHI CHAN2019-12-192019-12-1920090021-8979https://scholars.lib.ntu.edu.tw/handle/123456789/436095[SDGs]SDG15Extension of the Rosencwaig-Gersho-Fernelius photothermal deflection spectroscopy model to account for multiple reflections in epitaxial samplesjournal article10.1063/1.3254220WOS:000272932300022