Liu, C. W.C. W.LiuLee, M. H.M. H.LeeLee, Y. C.Y. C.LeeChen, P. S.P. S.ChenYu, C.-Y.C.-Y.YuWei, J.-Y.J.-Y.WeiMaikap, S.S.MaikapLiuCW2009-03-252018-07-062009-03-252018-07-062004http://ntur.lib.ntu.edu.tw//handle/246246/148217application/pdf308923 bytesapplication/pdfen-USEvidence of Si/SiGe heterojunction roughness scatteringjournal articlehttp://ntur.lib.ntu.edu.tw/bitstream/246246/148217/1/49.pdf