Graduate Inst. of Ind. Eng., National Taiwan Univ.Chen, ArgonArgonChenElsayed, E.A.E.A.Elsayed2007-04-192018-06-292007-04-192018-06-291998-10http://ntur.lib.ntu.edu.tw//handle/246246/2007041908561765The Shewhart control chart is a widely used statistical control tool that helps detect a possible process shift (out-of-control process). Though the Shewhart chart is in theory a monitoring tool that reveals only the result of a hypothesis testing. In practice chart's signalling is often used as the evidence for making process adjustment. In this paper we develop a process mean estimator for processes monitored by Shewhart charts. This mean the estimate can serve as an important reference for investigating assignable causes and taking appropriate corrective actions. A semiconductor fabrication process is used as an example to illustrate the methodology.application/pdf492525 bytesapplication/pdfen-USjournal article10.1109/ICSMC.1998.727592http://ntur.lib.ntu.edu.tw/bitstream/246246/2007041908561765/1/00727592.pdf