Characterization of single-crystalline aluminum thin film on (100) GaAs substrate

CHI-TE LIANG2018-09-102018-09-102013http://www.scopus.com/inward/record.url?eid=2-s2.0-84880825531&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/378923Characterization of single-crystalline aluminum thin film on (100) GaAs substratejournal article10.7567/JJAP.52.0458012-s2.0-84880825531WOS:000317189300036