Effects of drain-bias and ambient on hump formation in the transfer curves of positively gate-biased MgZnO thin film transistors

Tsai, Y.-S.Y.-S.TsaiLi, C.-H.C.-H.LiChiu, I.-C.I.-C.ChiuChin, H.-A.H.-A.ChinI-CHUN CHENGJIAN-ZHANG CHEN2020-04-282020-04-282013https://scholars.lib.ntu.edu.tw/handle/123456789/486643Effects of drain-bias and ambient on hump formation in the transfer curves of positively gate-biased MgZnO thin film transistorsconference paper10.1016/j.tsf.2012.06.0282-s2.0-84873733535https://www.scopus.com/inward/record.uri?eid=2-s2.0-84873733535&doi=10.1016%2fj.tsf.2012.06.028&partnerID=40&md5=1d379020791d1460e1c1db5af029895a