ToF-SIMS imaging of the nanoscale phase separation in polymeric light emitting diodes: Effect of nanostructure on device efficiency

Yu, Bang-YingBang-YingYuKuo, Che-HungChe-HungKuoWang, Wei-BenWei-BenWangYen, Guo-JiGuo-JiYenIida, Shin-ichiShin-ichiIidaChen, Sun-ZenSun-ZenChenLin, Wei-ChunWei-ChunLinLee, Szu-HsianSzu-HsianLeeKao, Wei-LunWei-LunKaoLiu, Chia-YiChia-YiLiuChang, Hsun-YunHsun-YunChangYou, Yun-WenYun-WenYouChang, Chi-JenChi-JenChangLiu, Chi-PingChi-PingLiuJou, Jwo-HueiJwo-HueiJouShyue, Jing-JongJing-JongShyue2012-10-242018-06-282012-10-242018-06-282011http://ntur.lib.ntu.edu.tw//handle/246246/243791en-USToF-SIMS imaging of the nanoscale phase separation in polymeric light emitting diodes: Effect of nanostructure on device efficiencyjournal article10.1039/c0an00335bhttp://ntur.lib.ntu.edu.tw/bitstream/246246/243791/-1/234.pdf