胡振國Lin, C. M.C. M.Lin王維新Hwu, Jenn-GwoJenn-GwoHwuWang, Way-SeenWay-SeenWang2009-02-242018-07-052009-02-242018-07-051985http://ntur.lib.ntu.edu.tw//handle/246246/140565en-USThe Effect of Charge-Temperature Aging on n-MOSFETconference paper