Ye, Y.-H.Y.-H.YeJiang, Y.-W.Y.-W.JiangTsai, M.-W.M.-W.TsaiChang, Y.-T.Y.-T.ChangChen, C.-Y.C.-Y.ChenTzuang, D.-C.D.-C.TzuangWu, Y.-T.Y.-T.WuSI-CHEN LEE2020-06-112020-06-112008https://scholars.lib.ntu.edu.tw/handle/123456789/498780https://www.scopus.com/inward/record.uri?eid=2-s2.0-58149215611&doi=10.1063%2f1.3058767&partnerID=40&md5=59aeb02e8bafad3fba159438367b3f6eThe reflection and emission spectra of Ag/SiO2 /Ag trilayer plasmonic thermal emitters with different SiO2 thicknesses are investigated. The top Ag film is perforated with periodic slits. It is found that the coupling of surface plasmons at the top and bottom Ag/SiO2 interface results in the redshift in thermal emission peaks. In this Ag/SiO 2/Ag plasmonic thermal emitter, the electromagnetic field exhibits either Fabry-Ṕrot resonance or propagating surface plasmons depending on the thickness of SiO2 layer. By varying the thickness of SiO 2 layer, transition from localized to grating-coupled propagating surface plasmon modes is observed. © 2008 American Institute of Physics.Electric fields; Electromagnetic fields; Emission spectroscopy; Optical data storage; Plasmons; Silicon compounds; Ag films; Grating structures; Silver films; Surface plasmon modes; Surface plasmons; Thermal emissions; Trilayer; Silverjournal article10.1063/1.30587672-s2.0-58149215611