Dept. of Electr. Eng., National Taiwan Univ.Sun, Chi-KuangChi-KuangSunWang, Juen-ChenJuen-ChenWangLiu, Tze-MingTze-MingLiuChiu, Yi-JenYi-JenChiuBowers, John E.John E.Bowers2007-04-192018-07-062007-04-192018-07-06Nov-99http://ntur.lib.ntu.edu.tw//handle/246246/2007041910021595http://ntur.lib.ntu.edu.tw/bitstream/246246/2007041910021595/1/00811887.pdfapplication/pdf188755 bytesapplication/pdfen-US[SDGs]SDG7Electron trapping time versus annealing temperature in low temperature grown GaAsconference paper10.1109/LEOS.1999.811887http://ntur.lib.ntu.edu.tw/bitstream/246246/2007041910021595/1/00811887.pdf