Understanding spectroscopic phonon-assisted defect features in CVD grown 3C-SiC/Si(1 0 0) by modeling and simulation

Talwar, Devki N.Devki N.TalwarFeng, Z. C.Z. C.Feng2009-03-112018-07-062009-03-112018-07-062004http://ntur.lib.ntu.edu.tw//handle/246246/144169application/pdf413599 bytesapplication/pdfen-USUnderstanding spectroscopic phonon-assisted defect features in CVD grown 3C-SiC/Si(1 0 0) by modeling and simulationjournal articlehttp://ntur.lib.ntu.edu.tw/bitstream/246246/144169/1/04.pdf