Spot and learn: A maximum-entropy patch sampler for few-shot image classification

Chu, W.-H.W.-H.ChuLi, Y.-J.Y.-J.LiChang, J.-C.J.-C.ChangYU-CHIANG WANG2021-05-052021-05-052019https://www.scopus.com/inward/record.url?eid=2-s2.0-85075999802&partnerID=40&md5=ebb7b43505a141d4949eb250171105b1https://scholars.lib.ntu.edu.tw/handle/123456789/559359Spot and learn: A maximum-entropy patch sampler for few-shot image classificationconference paper10.1109/CVPR.2019.006412-s2.0-85075999802