公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
1993 | PSBIST: A Partial-Scan Based Built-In Self-Test Scheme. | Lin, Chih-Jen; Zorian, Yervant; Bhawmik, Sudipta; CHIH-JEN LIN | Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993 |