公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
2010 | Strain engineering of nanoscale Si MOS devices | Huang, J.; Chang, S.-T.; Hsieh, B.-F.; Liao, M.-H.; Wang, W.-C.; Lee, C.-C.; MING-HAN LIAO | Thin Solid Films | | | |
2010 | Strain Engineering of Nanoscale Strained Si MOS Devices | B.-F. Hsieh; S. T. Chang; W.-C.Wang; M.-H. Liao; C.-C. Lee; J. Huang; MING-HAN LIAO | Thin Solid Films | | | |
2006 | strained Pt Schottky diodes on n-type Si and Ge | M. H. Liao; P.-S. Kuo; S.-R. Jan; S.-T. Chang; C. W. Liu; MING-HAN LIAO | Appl. Phys. Lett., | | | |
2006 | Strained Pt Schottky diodes on n-type Si and Ge | Liao, M.H. ; Chang, S.T.; Kuo, P.S.; Wu, H.-T.; Peng, C.-Y.; Liu, C.W. | Third International SiGe Technology and Device Meeting | 0 | | |
2014 | Stress and curvature of periodic trench structures on Sapphire substrate with GaN film | Hsieh, C.F.; Chen, C.W.; Chen, C.H.; Liao, M.H. | Procedia Engineering | 0 | 0 | |
2012 | Studies of boron diffusivities on (001) and (110) substrate orientation in Si and Ge along vertical/out-of plane and lateral/in-plane directions by SIMS and C-V measurement on the designed test pattern | M.-H. Liao; MING-HAN LIAO | The 6th International Conference on Technological Advances of Thin Films & Surface Coatings | | | |
2013 | Studies of boron diffusivities on (001) and (110) substrate orientation in Si and Ge along vertical/out-of plane and lateral/in-plane directions study | M. H.Liao | Thin Solid Films | | | |
2015 | Sub-60mV-Swing Negative-Capacitance FinFET without Hysteresis | M. H.Liao ; K. S. Li; P.-G. Chen; T. Y. Lai; C. H. Lin; C.-C. Cheng; C. C. Chen; M. H. Lee; M. C. Chen; J. M. Sheih; W. K. Yeh; F. L. Yang; Sayeef Salahuddin; Chenming Hu | IEEE Electron Device Meeting | 233 | 0 | |
2018 | Sub-60mV/dec Subthreshold Swing on Reliability of Ferroelectric HfZrOx Negative-Capacitacne FETs with DC Sweep and AC Stress Cycles | M. H.Liao ; K.-T. Chen; C.-Y. Liao; R.-C. Hong; S.-S. Gu; Y.-C. Chou; Z.-Y. Wang; S.-Y.Chen; G.-Y. Siang; H.-Y. Chen; C. Lo; P.-G. Chen; Y.-J. Lee; K.-S.Li; S. T. Chang; M. H. Lee | 2018 International Conference on Solid State Devices and Materials | | | |
2007 | Superior n-MOSFET performance by optimal stress design | Yang, Y.-J.; Liao, M.H. ; Liu, C.W.Yeh, L., Lee, T.-L., Liang, M.-S.; Yeh, L.; Lee, T.-L.; CHEE-WEE LIU | 2007 International Semiconductor Device Research Symposium | 1 | 0 | |
2008 | Superior n-MOSFET performance by optimal stress design | Liao, M.H. ; Yeh, L.; Lee, T.-L.; Liu, C.W.; CHEE-WEE LIU | IEEE Electron Device Letters | 15 | 12 | |
2018 | Synthesis and characterization of n-type NiO:Al thin films for fabrication of p-n NiO homojunctions | M. H.Liao ; H. Sun; S.-C. Chenh; P.-C. Ling; S.-M. Song | Journal of Physics D: Applied Physics | | | |
2017 | The systematic investigation of self-heating effect on CMOS Logic transistors from 20 nm to 5 nm technology nodes by experimental thermo-electric measurements and finite element modeling | M. H.Liao ; C.-P. Hsieh; C.-C. Lee | IEEE Transactions on Electron Devices | | | |
2017 | Systematic Investigation of Self-Heating Effect on CMOS Logic Transistors from 20 to 5 nm Technology Nodes by Experimental Thermoelectric Measurements and Finite Element Modeling | Liao, M.-H. ; Hsieh, C.-P.; Lee, C.-C. | IEEE Transactions on Electron Devices | 14 | 15 | |
2012 | The Systematic Study and Simulation Modeling on Dislocation Edge Stress Effects for Si N-MOSFETs | M.-H. Liao; MING-HAN LIAO | The 6th International Conference on Technological Advances of Thin Films & Surface Coatings | | | |
2012 | The systematic study and simulation modeling on nano-level dislocation edge stress effects | Liao, M.-H.; Chen, C.-H.; Chang, L.-C.; Yang, C.; LiaoMH ; ChenCH | Journal of Applied Physics | 10 | 5 | |
2013 | The demonstration of nonlinear analytic model for the strain field induced by thermal copper filled TSVs (through silicon via) | Liao, M.-H. ; Chen, C.-H.; Lee, J.J.; Chen, K.C.; JYH-JONE LEE | 2013 e-Manufacturing and Design Collaboration Symposium | 0 | 0 | |
2009 | The dependence of the performance of strained NMOSFETs on channel width | Yeh, L.; Liao, M.H. ; Chen, C.H.; Wu, J.; Lee, J.Y.-M.; Liu, C.W.; Lee, T.L.; CHEE-WEE LIU | IEEE Transactions on Electron Devices | 4 | 4 | |
2006 | The process and optoelectronic characterization of Ge-on-insulator | Lin, C.-H.; Yu, C.-Y.; Liao, M.H. ; Huang, C.-F.; Lee, C.-J.; Lee, C.-Y.; CHEE-WEE LIU | ECS Transactions | 1 | 0 | |
2018 | Thickness dependence of electrical conductivity and thermo-electric power of Bi2.0Te2.7Se0.3/Bi0.4Te3.0Sb1.6 thermo-electric devices | M. H.Liao ; K.-C. Huang; F.-A. Tsai; C.-Y. Liu; C. Lien; M.-H. Lee | AIP Advances | | | |