公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2012 | Systematic Open Via Diagnosis Based on Physical Features | CHIEN-MO LI ; P. J. Chen; C. C. Che; J. C. M. Li; K. Y. Tsai; S. F. Kuo; P. Y. Hsueh; Y. Y. Chen; J. N. Lee; CHIEN-MO LI | IEEE Silicon Debug and Diagnosis Workshop | |||
2013 | Test Clock Domain Optimization to Avoid Scan Shift Failures due to Flip-flop Simultaneous Triggering | CHIEN-MO LI ; Y. C. Huang; M. H. Tsai; W. S. Ding; J. C. M. Li; M. T. Chang; M. H. Tsai; C. M. Tseng; H. C. Li; CHIEN-MO LI | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | |||
2012 | Testing of TSV-induced Small Delay Faults for Three Dimensional Integrated Circuits, | CHIEN-MO LI ; C.Y. Kuo; C. J. Shih; J. C. M. Li; K. Chakrabarty; CHIEN-MO LI | IEEE 3D IC Test workshop | |||
2012 | Thermal-aware Test Schedule and TAM Co-Optimization for Three Dimensional IC | CHIEN-MO LI ; C. J. Shih; C. Y. Hsu; C. Y. Kou; J. C. M. Li; J. C. Rau; K. Chakrabarty; CHIEN-MO LI | Active and Passive Electronic Components |