公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
2005 | Diagnosis of Resistive-Open and Stuck-Open
Defects in Digital CMOS ICs | Li, Chien-Mo James; McCluskey, Edward J. | IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS & SYSTEMS 24(11) | | | |
2005 | Diagnosis of Resistive-Open and Stuck-Open Defects in Digital CMOS ICs | Li, James Chien-Mo; McCluskey, Edward J. | IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | | | |
2000 | Testing for tunneling opens. | Li, Chien-Mo James; McCluskey, Edward J.; CHIEN-MO LI | Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000 | | | |