Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
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2000 | Static property checking using ATPG vs. BDD techniques. | Huang, Chung-Yang; Yang, Bwolen; Tsai, Huan-Chih; Cheng, Kwang-Ting; CHUNG-YANG HUANG | Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000 |