Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
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2009 | Carrier backscattering characteristics of nanoscale strained complementary metal-oxide-semiconductor devices featuring the optimal stress engineering | Shu-Tong Chang; Ming-Han Liao; Chang-Chun Lee; Jacky Huang; Bing-Fong Hsieh; MING-HAN LIAO | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B |