公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
2007 | A built-in technique for measuring substrate and power supply digital switching noise using PMOS-based differential sensors and a waveform sampler in system-on-chip applications | Iorga, C.; Lu, Yi-Chang ; Dutton, R.W. | IEEE Transactions on Instrumentation and Measurement | | | |
2007 | A built-in technique for measuring substrate and power-supply digital switching noise using PMOS-based differential sensors and a waveform sampler in system-on-chip applications | Iorga, C.; Lu, Y.-C.; Dutton, R.W.; YI-CHANG LU | IEEE Transactions on Instrumentation and Measurement | 8 | 5 | |
2001 | A fast analytical technique for estimating the bounds of on-chip clock wire inductance | Lu, Y.-C.; Banerjee, K.; Celik, M.; Dutton, R.W.; YI-CHANG LU | Proceedings of the Custom Integrated Circuits Conference | 15 | 0 | |
2005 | Modeling and simulation of jitter in phase-locked loops due to substrate noise | Kim, J.W.; Lu, Y.-C.; Dutton, R.W.; YI-CHANG LU | BMAS 2005 - Proceedings of the 2005 IEEE International Behavioral Modeling and Simulation Workshop | 7 | 0 | |
2004 | Modeling of wave behavior of substrate noise coupling for mixed-signal IC design | Veronis, G.; Lu, Y.-C.; Dutton, R.W.; YI-CHANG LU | Proceedings - 5th International Symposium on Quality Electronic Design, ISQUED 2004 | 9 | 0 | |
2009 | Thermal Modeling and Device Noise Properties of Three-Dimensional–SOI Technology | Chen, Tze Wee; Chun, Jung Hoon; Lu, Yi-chang ; Navid, R.; Wang, Wei; Chen, Chang-Lee; Dutton, R.W. | IEEE Transactions on Electron Devices | | | |
2009 | Thermal modeling and device oise properties of three-dimensional-SOI technology | Chen, T.W.; Chun, J.-H.; Lu, Y.-C.; Navid, R.; Wang, W.; Chen, C.-L.; Dutton, R.W.; YI-CHANG LU | IEEE Transactions on Electron Devices | 3 | 1 | |