Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
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2016 | Comprehensive investigation on array-type dummy active diffused region and gate geometries using narrow NMOSFETs with SiC S/D stressors | Lee, Chang Chun; Cheng, Sen Wen; Hsieh, Chia Ping; Liao, Ming Han; Guo, Yu Huan; MING-HAN LIAO | International Journal of Nanotechnology |