公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
2006 | Differential power combining technique for general power amplifiers using lumped component network | CHEE-WEE LIU ; Chang, H.-L.; Lin, P.-T.; Hua, W.-C.; Lin, C.-P.; Lin, C.-Y.; Liu, C.W.; Yang, T.-Y.; Ma, G.-K.; CHEE-WEE LIU | Asia-Pacific Microwave Conference Proceedings, APMC | | | |
2004 | Ge outdiffusion effect on flicker noise in strained-Si nMOSFETs | CHEE-WEE LIU ; Hua, W.-C.; Lee, M.H.; Chen, P.S.; Maikap, S.; Liu, C.W.; Chen, K.M.; CHEE-WEE LIU | IEEE Electron Device Letters | | | |
2003 | Growth and Electrical Characteristics of Liquid-Phase Deposited SiO2 on Ge | Hsu, B.-C.; Hua, W.-C.; Shie, C.-R.; Chen, K.-F.; Liu, C. W. | Electrochemical and Solid State Letters | | | |
2003 | Growth and electrical characteristics of liquid-phase deposited SiO<inf>2</inf> on Ge | CHEE-WEE LIU ; Hsu, B.-C.; Hua, W.-C.; Shie, C.-R.; Chen, K.-F.; CHEE-WEE LIU | Electrochemical and Solid-State Letters | | | |
2007 | Performance Enhancement of the nMOSFET Low Noise Amplifier by Package Strain | Hua, W.-C.; Chang, H.-L.; Wang, T.; Lin, C.-Y.; Lin, C.-P.; Lu, S. S.; Meng, C. C.; Liu, C. W. | IEEE Transactions on Electron Devices | | | |
2007 | Performance enhancement of the nMOSFET low-noise amplifier by package strain | Hua, W.-C.; Chang, H.-L.; Wang, T.; Lin, C.-Y.; Lin, C.-P.; Lu, S.S.; Meng, C.C.; Liu, C.W.; SHEY-SHI LU ; CHEE-WEE LIU | IEEE Transactions on Electron Devices | | | |
2008 | Reduction of crosstalk between dual power amplifiers using laser treatment | CHEE-WEE LIU ; Chang, H.-L.; Kuo, P.-S.; Hua, W.-C.; Lin, C.-P.; Lin, C.-Y.; CHEE-WEE LIU | IEEE Microwave and Wireless Components Letters | | | |
2004 | The comparison of isolation technologies and device models on SiGe bipolar low noise amplifier | CHEE-WEE LIU ; Hua, W.-C.; Yang, T.-Y.; CHEE-WEE LIU | Applied Surface Science | | | |
2005 | Threading dislocation induced low frequency noise in strained-Si nMOSFETs | CHEE-WEE LIU ; Hua, W.-C.; Lee, M.H.; Chen, P.S.; Tsai, M.-J.; CHEE-WEE LIU | IEEE Electron Device Letters | | | |
2005 | Threading Dislocation Induced Low Frequency Noise in Strained-Si nMOSFETs | Hua, W.-C.; Lee, M.H.; Chen, P.S.; Tsai, M.-J.; Liu, C.W. | IEEE Electron Device Letters | | | |