公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2010 | 100 GHz Ga2O3/GaN single nanowire metal-oxide-semiconductor transistor | J.-W. Yu; Y.-R. Wu; J.-J. Huang; L.-H. Peng; LUNG-HAN PENG | 2010 IEEE International Electron Devices Meeting (IEDM) | |||
2010 | 75GHz Ga2O3/GaN single nanowire metal-oxide-semiconductor transisto | J.-W. Yu; Y.-R. Wu; J.-J. Huang; L.-H. Peng; JIAN-JANG HUANG ; LUNG-HAN PENG | 32nd IEEE Compound Semiconductor IC symposium | 2 | 0 | |
2006 | A low-cost jitter measurement technique for BIST applications | JIUN-LANG HUANG ; J.-J. Huang; Y.-S. Liu | Journal of Electronic Testing: Theory and Applications (JETTA) | 6 | 4 | |
2010 | Effects of gate-bias stress on ZnO thin-film transistors | L.-Y. Su; H.-Y. Lin; S.-L. Wang; Y.-H. Yeh; C.-C. Cheng; L.-H. Peng; J.-J. Huang; JIAN-JANG HUANG ; LUNG-HAN PENG | Journal of the Society for Information Display | 4 | 4 | |
2005 | Focus Control Method for Delta-Sigma Based Image Formation Device | P.-C. Li; J.-J. Huang; S.-E. Chen; Y.-L. Kao; T.I. Chu; PAI-CHI LI | ||||
2003 | Method for dynamic focus control | J.-J. Huang; P.-C. Li; PAI-CHI LI | ||||
2008 | Testing LCD Source Driver IC with Built-On-Scribe-Line Test Circuitry | J.-J. Huang; J.-L. Huang; JIUN-LANG HUANG | Asian Test Symposium | 2 | 0 | |
2018 | UBAT of UFFO/Lomonosov: The X-Ray Space Telescope to Observe Early Photons from Gamma-Ray Bursts | Jeong S.; Panasyuk M.I.; Reglero V.; Connell P.; Kim M.B.; M.-H. A. Huang; Rodrigo J.M.; Eyles C.; Lim H.; Gaikov G.; Robert P Chen; J. W. Nam; J.-J. Huang; T.-C. Liu | Space Science Reviews | 7 | 8 |