公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
1996 | Intelligent process diagnosis based on end-of-line electrical test data | Guo, Ruey-Shan ; Tsai, Cheng-Kai; Lee, Jian-Huei; Chang, Shi-Chung | Electronics Manufacturing Technology Symposium, 1996. | 8 | 0 | |
1996 | Intelligent process diagnosis based on end-of-line electrical test data | Guo, Ruey-Shan; Tsai, Cheng-Kai; Lee, Jian-Huei; SHI-CHUNG CHANG | IEEE/CPMT International Electronic Manufacturing Technology (IEMT) Symposium |