Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
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2021 | How the common retention acceleration method of 3D NAND flash memory goes wrong? | Li Q; Ye M; Xue C.J; Li Q; Ye M; Xue C.J.; TEI-WEI KUO | HotStorage 2021 - Proceedings of the 13th ACM Workshop on Hot Topics in Storage and File Systems | 3 | 0 | |
2020 | Shaving retries with sentinels for fast read over high-density 3d flash | Li Q; Ye M; Cui Y; Shi L; Li X; Xue C.J.; TEI-WEI KUO | Proceedings of the Annual International Symposium on Microarchitecture, MICRO | 16 | 0 | |
2022 | Simultaneous construction of impermeable dual-shell stabilizing fluoride phosphors for white light-emitting diodes | Luo P; Ye M; Zhou W; Wan P; Ma Z; Qiu Z; Zhang J; RU-SHI LIU ; Lian S. | Chemical Engineering Journal | |||
2022 | Stop unnecessary refreshing: extending 3D NAND flash lifetime with ORBER | Ye M; Li Q; Gao C; Deng S; TEI-WEI KUO ; Xue C.J. | CCF Transactions on High Performance Computing | 1 | 1 | |
2020 | Valid Window: A New Metric to Measure the Reliability of NAND Flash Memory | Ye M; Li Q; Nie J; Kuo T.-W; Xue C.J.; TEI-WEI KUO | Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020 |