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Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link | |
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1 | 2021 | Effect of Electrons Trapping/De-Trapping at P(VDF-TrFE)/SiO Interface in Metal/Ferroelectric/Oxide/Semiconductor Structure with Ultra-Thin SiO by Anodization | Chen Y.-C; Chen P.-H; Shieh J; TZONG-LIN JAY SHIEH ; CHIH-TING LIN | IEEE Transactions on Nanotechnology | 0 | 0 |