Results 1-3 of 3 (Search time: 0.008 seconds).
Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link | |
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1 | 2018 | Test pattern compression for probabilistic circuits | Chang, C.-M.; Yang, K.-J.; Li, J.C.-M.; CHIEN-MO LI | Proceedings of the Asian Test Symposium | 0 | 0 | |
2 | 2018 | Parallel order ATPG for test compaction | Chen, Y.-W.; Ho, Y.-H.; Chang, C.-M.; Yang, K.-C.; Li, M.-T.; CHIEN-MO LI | 2018 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2018 | |||
3 | 2017 | Robust test pattern generation for hold-time faults in nanometer technologies | Ho, Y.-H.; Chen, Y.-W.; Chang, C.-M.; Yang, K.-C.; CHIEN-MO LI | 2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017 |