https://scholars.lib.ntu.edu.tw/handle/123456789/148806
Title: | Determine the Minority Carrier Lifetime in P/N Junction Diode Using the Lag Effect of a CID Emulator | Authors: | Tseng, Y. H. 林浩雄 Lin, Hao-Hsiung |
Issue Date: | 1987 | Start page/Pages: | 213-216 | Source: | 17th EDMS | URI: | http://ntur.lib.ntu.edu.tw//handle/246246/121318 |
Appears in Collections: | 電機工程學系 |
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