https://scholars.lib.ntu.edu.tw/handle/123456789/149737
Title: | Performance prediction and function recovery of CMOS circuits damaged by Co-60 irradiation | Authors: | Chang-Liao, K.-S. Hwu, J.-G. |
Issue Date: | Jul-1992 | Start page/Pages: | - | Source: | Circuits, Devices and Systems, IEE Proceedings G | URI: | http://ntur.lib.ntu.edu.tw//handle/246246/2007041910042711 | ISSN: | N/A | Other Identifiers: | 0956-3768 |
Appears in Collections: | 電機工程學系 |
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00143328.pdf | 389.67 kB | Adobe PDF | View/Open |
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