https://scholars.lib.ntu.edu.tw/handle/123456789/155350
標題: | Microwave diversity imaging using six-port reflectometer | 作者: | HSIN-CHIA LU TAH HSIUNG CHU |
關鍵字: | Microwave diversity imaging; Six-port reflectometer | 公開日期: | 1999 | 卷: | 47 | 期: | 1 | 起(迄)頁: | 84-87 | 來源出版物: | IEEE Transactions on Microwave Theory and Techniques | 摘要: | A microwave diversity imaging system conventionally uses a vector network analyzer (VNA) to directly measure the object scattered field (amplitude and phase) over a selected frequency range and viewing angles, then reconstructs the scattering object characteristic function through two-dimensional Fourier inversion. In this paper, we present a cost-effective microwave diversity imaging system using a six-port reflectometer, which measures four amplitude (or power) values to acquire the object scattered field indirectly. One can then eliminate the coherent detectors in a VNA. The calibration procedure for this microwave diversity imaging measurement is also described. Experimental results of three types of scattering objects, a metallic cylinder, four distributed line scatterers, and a 72:1 scaled B-52 aircraft model, are presented using the described six-port microwave imaging system. © 1999 IEEE. |
URI: | http://ntur.lib.ntu.edu.tw//handle/246246/144052 http://ntur.lib.ntu.edu.tw/bitstream/246246/144052/1/02.pdf https://www.scopus.com/inward/record.uri?eid=2-s2.0-0032803621&doi=10.1109%2f22.740082&partnerID=40&md5=b0a7eadcb1e7a0a72006bd08198d2d59 |
ISSN: | 00189480 | DOI: | 10.1109/22.740082 | SDG/關鍵字: | Calibration; Electromagnetic wave scattering; Fourier transforms; Imaging systems; Microwave devices; Microwave diversity imaging; Reflectometers |
顯示於: | 電機工程學系 |
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