https://scholars.lib.ntu.edu.tw/handle/123456789/155872
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Liu, C. W. | en |
dc.contributor.author | Hsieh, T. X. | en |
dc.contributor.author | LiuCW | - |
dc.creator | Liu, C. W.; Hsieh, T. X. | - |
dc.date | 2000 | en |
dc.date.accessioned | 2009-03-25T07:48:36Z | - |
dc.date.accessioned | 2018-07-06T16:47:46Z | - |
dc.date.available | 2009-03-25T07:48:36Z | - |
dc.date.available | 2018-07-06T16:47:46Z | - |
dc.date.issued | 2000 | - |
dc.identifier.uri | http://ntur.lib.ntu.edu.tw//handle/246246/148153 | - |
dc.format | application/pdf | en |
dc.format.extent | 93800 bytes | - |
dc.format.mimetype | application/pdf | - |
dc.language | en | en |
dc.language.iso | en_US | - |
dc.relation | Solid-State Electronics 44 (9): 1707-1710 | en |
dc.relation.ispartof | Solid-State Electronics | en_US |
dc.title | Analytic modeling of the subthreshold behavior in MOSFET | en |
dc.type | journal article | en |
dc.relation.pages | 1707-1710 | - |
dc.relation.journalvolume | 44 | - |
dc.relation.journalissue | 9 | - |
dc.identifier.uri.fulltext | http://ntur.lib.ntu.edu.tw/bitstream/246246/148153/1/13.pdf | - |
item.languageiso639-1 | en_US | - |
item.cerifentitytype | Publications | - |
item.fulltext | with fulltext | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.openairetype | journal article | - |
item.grantfulltext | open | - |
crisitem.author.dept | Electrical Engineering | - |
crisitem.author.orcid | 0000-0003-1975-3988 | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
顯示於: | 電機工程學系 |
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