https://scholars.lib.ntu.edu.tw/handle/123456789/155945
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Hua, W.-C. | en |
dc.contributor.author | Lee, M.H. | en |
dc.contributor.author | Chen, P.S. | en |
dc.contributor.author | Tsai, M.-J. | en |
dc.contributor.author | Liu, C.W. | en |
dc.creator | Hua, W.-C.; Lee, M.H.; Chen, P.S.; Tsai, M.-J.; Liu, C.W. | en |
dc.date | 2005 | en |
dc.date.accessioned | 2009-03-25T09:03:34Z | - |
dc.date.accessioned | 2018-07-06T16:49:44Z | - |
dc.date.available | 2009-03-25T09:03:34Z | - |
dc.date.available | 2018-07-06T16:49:44Z | - |
dc.date.issued | 2005 | - |
dc.identifier.uri | http://ntur.lib.ntu.edu.tw//handle/246246/148229 | - |
dc.format | application/pdf | en |
dc.format.extent | 283902 bytes | - |
dc.format.mimetype | application/pdf | - |
dc.language | en | en |
dc.language.iso | en_US | - |
dc.relation | IEEE Electron Device Letters 26 (9): 667-669 | en |
dc.relation.ispartof | IEEE Electron Device Letters | - |
dc.title | Threading Dislocation Induced Low Frequency Noise in Strained-Si nMOSFETs | en |
dc.type | journal article | en |
dc.relation.pages | 667-669 | - |
dc.relation.journalvolume | 26 | - |
dc.relation.journalissue | 9 | - |
dc.identifier.uri.fulltext | http://ntur.lib.ntu.edu.tw/bitstream/246246/148229/1/57.pdf | - |
item.languageiso639-1 | en_US | - |
item.cerifentitytype | Publications | - |
item.fulltext | with fulltext | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.openairetype | journal article | - |
item.grantfulltext | open | - |
顯示於: | 電機工程學系 |
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