https://scholars.lib.ntu.edu.tw/handle/123456789/155964
Title: | Transport mechanism of SiGe dot MOS tunneling diodes | Authors: | Kuo, P.-S. Lin, C.-H. Peng, C.-Y. Fu, Y.-C. Liu, C.W. |
Issue Date: | 2007 | Journal Volume: | 28 | Journal Issue: | 7 | Start page/Pages: | 596-598 | Source: | IEEE Electron Device Letters | URI: | http://ntur.lib.ntu.edu.tw//handle/246246/148248 |
Appears in Collections: | 電機工程學系 |
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